New Electronics

AFM cantilever features integral calibration sensor

The atomic force microscope (AFM) is used by scientists to resolve features as small as individual atoms. Instead of magnifying with a lens, AFMs use a flexible cantilever with a tiny tip to 'feel' ...
technologynetworks

Asylum Research Introduces GetReal™ Automated Probe Calibration

Asylum Research has announced the release of the new GetReal™ Automated Probe Calibration feature. With just one click, GetReal fully calibrates the atomic force microscope (AFM) probe sensitivity and ...
AZoNano

Gold Nanoparticles on Modified Glass Surface as Height Calibration Standard for Atomic Force Microscopy Operating in Contact and Tapping Mode

In the field of nanotechnology, where properties and functionality of nanostructures critically depend on their dimensions, measuring size differences of the order of nanometers or even angstroms is ...
AZoNano

Park NX20 – AFM for Large Samples and Failure Analysis

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The NX20’s novel design allows users to ...