Phys.org

Standard reference cantilevers for atomic force microscopy spring constant calibration

Atomic force microscopy (AFM) is a popular technique for interrogating surfaces on the micro and nano scales. The most common use for AFM is imaging; however, there are a variety of more specialized ...
Nature

Combination of Universal Mechanical Testing Machine with Atomic Force Microscope for Materials Research

Surface deformation and fracture processes of materials under external force are important for understanding and developing materials. Here, a combined horizontal universal mechanical testing machine ...
Electronic Design

AFM/Raman Spectroscopy System Provides Nanoscale Material Identification

May 16, 2013. Agilent Technologies Inc. has announced the availability of a high-performance AFM/Raman system for life-science and materials-science applications. The system seamlessly integrates the ...
Electronic Design

Park Systems ships AFM nanoscopic tool

Santa Clara, CA. Park Systems said it is now shipping the Park SmartScan atomic force microscopy (AFM) nanoscopic tool, which boosts productivity by creating point-and-click reliable nanoscale images.
Nature

AI-based atomic force microscopy image analysis allows to predict electrochemical impedance spectra of defects in tethered bilayer membranes

Atomic force microscopy (AFM) image analysis of supported bilayers, such as tethered bilayer membranes (tBLMs) can reveal the nature of the membrane damage by pore-forming proteins and predict the ...